Several advanced techniques are used to characterize SMSI: - Transmission Electron Microscopy (TEM): Provides direct visual evidence of the structural changes and encapsulation of metal particles by the support. - X-ray Photoelectron Spectroscopy (XPS): Used to study the electronic changes in the metal due to interaction with the support. - Temperature-Programmed Reduction (TPR): Helps in identifying the reduction behavior of the support and metal. - Infrared Spectroscopy (IR): Useful for studying changes in surface species and adsorbed molecules. - Extended X-ray Absorption Fine Structure (EXAFS): Provides information on the local structure around the metal atoms.
