surface data

How is Surface Data Collected?

Surface data can be collected using various analytical techniques. Some of the commonly used methods include:
X-Ray Photoelectron Spectroscopy (XPS) - Provides information on surface composition and chemical states.
Scanning Electron Microscopy (SEM) - Offers detailed images of the surface morphology.
Atomic Force Microscopy (AFM) - Used to measure the surface roughness and topography.
Brunauer-Emmett-Teller (BET) Analysis - Measures the surface area and porosity of the material.
Temperature-Programmed Desorption (TPD) - Assesses surface reactivity by studying the desorption of adsorbed species.

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