EXAFS measurements are typically performed at synchrotron radiation sources, which provide the high-intensity, tunable X-rays needed for the technique. As the energy of the incident X-rays is varied, the absorption coefficient is recorded. When the energy is just above the absorption edge of a specific element, the ejected photoelectrons scatter off neighboring atoms. The resulting oscillatory pattern in the absorption coefficient, the EXAFS signal, is analyzed to extract structural information about the local atomic environment.
