Extended X-ray Absorption Fine Structure (EXAFS) is a spectroscopic technique used to study the local structural environment of specific types of atoms within a material. It involves measuring the absorption of X-rays as a function of energy, typically at synchrotron facilities. When X-rays are absorbed by atoms, they can cause the ejection of core electrons, and the resulting photoelectrons interact with surrounding atoms, creating an interference pattern that provides information about the local structure.
