Sample preparation for TEM is critical because the sample must be thin enough for electrons to pass through. Common methods include:
1. Ultramicrotomy: Cutting ultrathin sections of the sample. 2. Ion Milling: Thinning the sample using an ion beam. 3. Chemical Etching: Removing material to achieve the desired thickness.
Proper sample preparation is essential to avoid artifacts that could mislead the interpretation of TEM images.
