line defects

How are Line Defects Characterized?

The characterization of line defects involves advanced techniques such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). These techniques allow researchers to visualize the arrangement and density of dislocations at the atomic scale. Additionally, spectroscopic methods like X-ray diffraction (XRD) and Raman spectroscopy can provide information about the structural changes associated with line defects.

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