- X-ray Diffraction (XRD): XRD is a common method used to identify the crystallographic structure and orientation by analyzing the diffraction pattern of X-rays incident on the material. - Electron Backscatter Diffraction (EBSD): EBSD is used in scanning electron microscopy (SEM) to determine the crystallographic orientation of materials at a microstructural level. - Transmission Electron Microscopy (TEM): TEM provides high-resolution images that can reveal crystallographic details, including defects and dislocations.
