What are the Challenges in Studying Surface Irregularities?
Studying surface irregularities poses several challenges, primarily due to their microscopic nature. Advanced characterization techniques such as Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and X-ray Photoelectron Spectroscopy (XPS) are often required to analyze these features. Additionally, the dynamic nature of catalytic processes can make it difficult to observe and quantify the exact role of surface irregularities in real-time.
