silica supported metal oxides

How to Characterize Silica Supported Metal Oxides?

Characterization techniques include X-ray diffraction (XRD), transmission electron microscopy (TEM), scanning electron microscopy (SEM), and BET surface area analysis. XRD helps in identifying the crystalline phases of the metal oxide. TEM and SEM provide information on the morphology and particle size distribution. BET analysis is used to determine the surface area and porosity of the catalyst. Additionally, techniques like X-ray photoelectron spectroscopy (XPS) and temperature-programmed reduction (TPR) are employed to study the oxidation states and reducibility of the metal oxides.

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