surface heterogeneity

How is Surface Heterogeneity Characterized?

Surface heterogeneity can be characterized using a variety of techniques:
Scanning Tunneling Microscopy (STM): Provides atomic-scale images of the surface topography.
X-ray Photoelectron Spectroscopy (XPS): Analyzes the chemical composition of the surface.
Temperature-Programmed Desorption (TPD): Studies the interaction of gases with the surface.
Atomic Force Microscopy (AFM): Measures the surface roughness and topography at the nanoscale.

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