Standard materials are characterized using a variety of techniques. These include:
- X-ray Diffraction (XRD) for crystallographic information - Brunauer-Emmett-Teller (BET) Analysis for surface area - Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) for morphology - X-ray Photoelectron Spectroscopy (XPS) for surface chemistry - Inductively Coupled Plasma Mass Spectrometry (ICP-MS) for elemental composition
Each of these techniques provides critical data that contribute to the comprehensive characterization of the material.
