catalyst films

How are Catalyst Films Characterized?

Characterization of catalyst films is essential to understand their properties and performance. Techniques such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), and X-ray diffraction (XRD) are commonly used to analyze the morphology, structure, and composition of the films. Spectroscopic methods like X-ray photoelectron spectroscopy (XPS) and Fourier-transform infrared spectroscopy (FTIR) provide insights into the chemical states and functional groups present on the surface.

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